Save
Upgrade to remove ads
Busy. Please wait.
Log in with Clever
or
show password
Forgot Password?
Don't have an account?  Sign up 
Sign up using Clever
or
Username is available taken
show password


Make sure to remember your password. If you forget it there is no way for StudyStack to send you a reset link. You would need to create a new account. Your email address is only used to allow you to reset your password. See our Privacy Policy and Terms of Service.

Already a StudyStack user? Log In

Reset Password
Enter the associated with your account, and we'll email you a link to reset your password.
focusNode
Didn't know it?
click below
 
Knew it?
click below
Don't Know
Remaining cards (0)
Know
0:00
edit
Embed Code - If you would like this activity on your web page, copy the script below and paste it into your web page.

  Normal Size     Small Size show me how

FIS 340

Elemental Analysis

TermDefinition
ways to obtain an x-ray bombard the target with electrons (particle) or other x-rays (photons)
SEM-EDS- general operating principle from a heated filament (W, Crystal), an electron beam goes through lenses (to focus it) in the vacuum column, then to the sample in its chamber. The sample's electrons are excited, and release characteristic x-rays as they relax and can then be measured.
XRF- general operating principle x-ray beams are sent from their tube (Mo, Rh) to the sample, exciting the sample's electrons. As the electrons relax, they give off characteristic x-rays
Which elemental analysis methods are quantitative? ICP-MS, ICP-OES, LIBS, LAICPMS (SEM-EDS and XRF are semi-quant)
Which elemental analysis methods are qualitative? SEM-EDS, XRF, ICP-MS, ICP-OES, LIBS, LAICPMS
Classify each method as Surface, Micro-Bulk, or Bulk analysis SEM-EDS: surface XRF: Micro-bulk ICP-MS/OES: bulk LIBS: surface or micro-bulk LAICPMS: micro-bulk
What is the typical LOD for each method? SEM-EDS: 1000 ppms XRF: 100 ppms ICP-MS/OES: < 0.01 ug/L LIBS: 5-50 ppms LAICPMS: < 1 ppms
Classify each method's precision as poor, fair, good, or excellent SEM-EDS: poor XRF: fair ICP-MS/OES: excellent LIBS: good LAICPMS: excellent
Elemental Analysis the identification and/or quantification of elements/isotopes present in a material
Characteristic X-Rays used to identify the elemental composition of materials, an energy photon generated by an inelastic collision or interaction that occurs between an external particle or photon and an atom
Bremsstrahlung Radiation radiation produced from the acceleration (either + or -) of a charged particle like an electron
Interaction Volume region within a sample where incident x-rays penetrate, causing atoms to fluoresce
plasma a superheated gas with positively charged ions and negatively charged electrons (the fourth state of matter beyond gas)
isotope atomic number (# of protons) is the same, but number of neutrons is different (chemical characteristics the same, physical properties different)
isobar atomic number (# of protons) is different, but atomic weight happens to be the same so species appear at the same mass (chemical characteristics differ, physical properties similar)
polyatomic interference an issue in ICP-MS analysis where two ions have the same m/z, and so cannot be distinguished from each other
laser ablation a progressive and superficial destruction of a material by melting, fusion, sublimation, erosion, and explosion
provenance using analysis to determine the area of origin or history about a piece of data or evidence
SEM-EDS source electron beam created by the heating of a tungsten filament
XRF source x-ray source (photon source: Rh, Mo)
ICP-MS/OES source hot plasma- the heat ionizes the sample
LIBS source laser beam
LAICPMS source monochromatic laser beam
SEM-EDS and XRF detectors EDS: energy dispersive spectrometry WDS: wavelength dispersive spectrometry
classify each method as nondestructive, minimally destructive, or destructive SEM-EDS: Non XRF: Non ICP-MS/OES: destructive LIBS: minimally destructive LAICPMS: minimally destructive
SEM x and y axis units x-axis: energy (keV) y-axis: counts
XRF x and y axis units x-axis: energy (keV) y-axis: counts
ICP-MS x and y axis units x-axis: m/z ratio y-axis: concentration
ICP-OES x and y axis units x-axis: wavelength (nm) y-axis: intensity
LIBS x and y axis units x-axis: wavelength (nm) y-axis: emission intensity
LAICPMS x and y axis units x-axis: m/z ratio y-axis: counts
SEM-EDS sample volume < 1 um cube
XRF sample volume > 20 um cube
ICP-MS/OES sample volume 2-15 mL
LIBS sample volume 30-100 um diameter
LAICPMS sample volume 10-100 um diameter
Created by: kadenceiguess
 

 



Voices

Use these flashcards to help memorize information. Look at the large card and try to recall what is on the other side. Then click the card to flip it. If you knew the answer, click the green Know box. Otherwise, click the red Don't know box.

When you've placed seven or more cards in the Don't know box, click "retry" to try those cards again.

If you've accidentally put the card in the wrong box, just click on the card to take it out of the box.

You can also use your keyboard to move the cards as follows:

If you are logged in to your account, this website will remember which cards you know and don't know so that they are in the same box the next time you log in.

When you need a break, try one of the other activities listed below the flashcards like Matching, Snowman, or Hungry Bug. Although it may feel like you're playing a game, your brain is still making more connections with the information to help you out.

To see how well you know the information, try the Quiz or Test activity.

Pass complete!
"Know" box contains:
Time elapsed:
Retries:
restart all cards